ASM Handbook Volume 10 Materials Characterization 1st Edition by George Crankovic ISBN 0871700166 9780871700162

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ISBN 10: 0871700166
ISBN 13: 9780871700162
Author: George Crankovic

ASM Handbook Volume 10 Materials Characterization 1st Edition Table of contents:

Chapter 1: Fundamentals of Materials Characterization
1.1 Overview of Characterization Techniques
1.2 Principles of Material Behavior and Structure
1.3 Sampling and Sample Preparation for Characterization
1.4 Standards and Best Practices in Characterization

Chapter 2: Microscopy Techniques
2.1 Optical Microscopy: Principles and Applications
2.2 Scanning Electron Microscopy (SEM)
2.3 Transmission Electron Microscopy (TEM)
2.4 Atomic Force Microscopy (AFM)
2.5 Scanning Probe Microscopy (SPM)
2.6 Advanced Imaging Techniques and Applications

Chapter 3: X-Ray and Diffraction Techniques
3.1 X-Ray Diffraction (XRD) for Phase Identification
3.2 X-Ray Fluorescence (XRF) for Elemental Analysis
3.3 Small-Angle X-Ray Scattering (SAXS)
3.4 Neutron Diffraction and Its Applications

Chapter 4: Spectroscopic Techniques
4.1 Fourier Transform Infrared Spectroscopy (FTIR)
4.2 Raman Spectroscopy
4.3 Ultraviolet-Visible (UV-Vis) Spectroscopy
4.4 X-Ray Photoelectron Spectroscopy (XPS)
4.5 Nuclear Magnetic Resonance (NMR) Spectroscopy
4.6 Mass Spectrometry for Material Characterization

Chapter 5: Thermal and Mechanical Testing
5.1 Differential Scanning Calorimetry (DSC)
5.2 Thermogravimetric Analysis (TGA)
5.3 Dynamic Mechanical Analysis (DMA)
5.4 Hardness Testing Methods
5.5 Tensile and Compression Testing Techniques
5.6 Fracture Toughness and Impact Testing

Chapter 6: Surface and Thin Film Characterization
6.1 Surface Profiling and Roughness Measurement
6.2 Ellipsometry for Thin Film Analysis
6.3 Surface Chemistry and Composition Analysis
6.4 Scanning Auger Microscopy (SAM)
6.5 Focused Ion Beam (FIB) Systems for Microstructural Analysis

Chapter 7: Elemental and Chemical Analysis
7.1 Energy Dispersive X-Ray Spectroscopy (EDS)
7.2 Inductively Coupled Plasma Mass Spectrometry (ICP-MS)
7.3 Atomic Absorption Spectroscopy (AAS)
7.4 X-Ray Absorption Spectroscopy (XAS)
7.5 Glow Discharge Mass Spectrometry (GDMS)

Chapter 8: Advanced Characterization Techniques
8.1 High-Resolution Electron Microscopy (HREM)
8.2 Microhardness and Nanoindentation
8.3 In-Situ and Real-Time Characterization Methods
8.4 Synchrotron Radiation Techniques
8.5 Computed Tomography (CT) for Materials Analysis

Chapter 9: Characterization of Specific Materials
9.1 Metals and Alloys: Characterization Methods
9.2 Ceramics and Glasses
9.3 Polymers and Composites
9.4 Semiconductors and Electronic Materials
9.5 Biomaterials and Biocompatibility Studies
9.6 Nanomaterials and Nanocomposites

Chapter 10: Data Analysis and Interpretation
10.1 Statistical Methods in Materials Characterization
10.2 Image Analysis and Quantification
10.3 Data Processing and Modeling
10.4 Uncertainty and Error Analysis in Characterization
10.5 Best Practices for Characterization Reporting

Chapter 11: Applications of Materials Characterization
11.1 Materials Development and Quality Control
11.2 Failure Analysis and Forensic Engineering
11.3 Characterization in Manufacturing Processes
11.4 Materials Characterization in Environmental Studies
11.5 Applications in Aerospace, Automotive, and Electronics

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