ASM Handbook Volume 10 Materials Characterization 1st Edition by George Crankovic – Ebook PDF Instant Download/Delivery: 0871700166 ,9780871700162
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ISBN 10: 0871700166
ISBN 13: 9780871700162
Author: George Crankovic
ASM Handbook Volume 10 Materials Characterization 1st Edition Table of contents:
Chapter 1: Fundamentals of Materials Characterization
1.1 Overview of Characterization Techniques
1.2 Principles of Material Behavior and Structure
1.3 Sampling and Sample Preparation for Characterization
1.4 Standards and Best Practices in Characterization
Chapter 2: Microscopy Techniques
2.1 Optical Microscopy: Principles and Applications
2.2 Scanning Electron Microscopy (SEM)
2.3 Transmission Electron Microscopy (TEM)
2.4 Atomic Force Microscopy (AFM)
2.5 Scanning Probe Microscopy (SPM)
2.6 Advanced Imaging Techniques and Applications
Chapter 3: X-Ray and Diffraction Techniques
3.1 X-Ray Diffraction (XRD) for Phase Identification
3.2 X-Ray Fluorescence (XRF) for Elemental Analysis
3.3 Small-Angle X-Ray Scattering (SAXS)
3.4 Neutron Diffraction and Its Applications
Chapter 4: Spectroscopic Techniques
4.1 Fourier Transform Infrared Spectroscopy (FTIR)
4.2 Raman Spectroscopy
4.3 Ultraviolet-Visible (UV-Vis) Spectroscopy
4.4 X-Ray Photoelectron Spectroscopy (XPS)
4.5 Nuclear Magnetic Resonance (NMR) Spectroscopy
4.6 Mass Spectrometry for Material Characterization
Chapter 5: Thermal and Mechanical Testing
5.1 Differential Scanning Calorimetry (DSC)
5.2 Thermogravimetric Analysis (TGA)
5.3 Dynamic Mechanical Analysis (DMA)
5.4 Hardness Testing Methods
5.5 Tensile and Compression Testing Techniques
5.6 Fracture Toughness and Impact Testing
Chapter 6: Surface and Thin Film Characterization
6.1 Surface Profiling and Roughness Measurement
6.2 Ellipsometry for Thin Film Analysis
6.3 Surface Chemistry and Composition Analysis
6.4 Scanning Auger Microscopy (SAM)
6.5 Focused Ion Beam (FIB) Systems for Microstructural Analysis
Chapter 7: Elemental and Chemical Analysis
7.1 Energy Dispersive X-Ray Spectroscopy (EDS)
7.2 Inductively Coupled Plasma Mass Spectrometry (ICP-MS)
7.3 Atomic Absorption Spectroscopy (AAS)
7.4 X-Ray Absorption Spectroscopy (XAS)
7.5 Glow Discharge Mass Spectrometry (GDMS)
Chapter 8: Advanced Characterization Techniques
8.1 High-Resolution Electron Microscopy (HREM)
8.2 Microhardness and Nanoindentation
8.3 In-Situ and Real-Time Characterization Methods
8.4 Synchrotron Radiation Techniques
8.5 Computed Tomography (CT) for Materials Analysis
Chapter 9: Characterization of Specific Materials
9.1 Metals and Alloys: Characterization Methods
9.2 Ceramics and Glasses
9.3 Polymers and Composites
9.4 Semiconductors and Electronic Materials
9.5 Biomaterials and Biocompatibility Studies
9.6 Nanomaterials and Nanocomposites
Chapter 10: Data Analysis and Interpretation
10.1 Statistical Methods in Materials Characterization
10.2 Image Analysis and Quantification
10.3 Data Processing and Modeling
10.4 Uncertainty and Error Analysis in Characterization
10.5 Best Practices for Characterization Reporting
Chapter 11: Applications of Materials Characterization
11.1 Materials Development and Quality Control
11.2 Failure Analysis and Forensic Engineering
11.3 Characterization in Manufacturing Processes
11.4 Materials Characterization in Environmental Studies
11.5 Applications in Aerospace, Automotive, and Electronics
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George Crankovic,ASM Handbook,Materials Characterization