MOS Interface Physics, Process and Characterization 1st Edition by Shengkai Wang 1032106271 9781032106274

MOS Interface Physics, Process and Characterization 1st Edition Shengkai Wang – Ebook Instant Download/Delivery ISBN(s): 9781032106274,1032106271

Product details:

• ISBN 10:1032106271
• ISBN 13:9781032106274
• Author: Shengkai Wang, Xiaolei Wang

The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit, and is therefore a fundamental building block of the information society. Indeed, high quality MOS structure is the key to achieving high performance devices and integrated circuits. Meanwhile, the control of interface physics, process and characterization methods determine the quality of MOS structure.  

Table contents:

Chapter 1 ▪ Physics of Interface

Chapter 2 ▪ MOS Processes

Chapter 3 ▪ MOS Characterizations

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